Deconstruction of Key Core Technologies and Their Breakthrough Mechanisms: A Comparative Study Based on Lithography Machines and 3D NAND Flash Chips
Miao Pu1,2, Zhang Xiaoyan1
1. School of Economics and Management,Shanghai Maritime University,Shanghai 200135,China; 2. School of Tourism and Wellness,Changzhou Vocational Institute of Industry Technology,Changzhou 213164,China
Abstract：Breaking through key core technologies is a strategic measure for China to achieve technological self-reliance and self-strengthening.By analyzing the representative cases of Shanghai Micro Electronics achieving a breakthrough in 90-nanometer lithography machines and Yangtze Memory Technologies achieving a breakthrough in 3D NAND flash chips,this study deconstructs key core technologies and reveals their breakthrough mechanisms.The findings are as follows.The composition of key core technologies involves nine types of technologies that are determined by the intersection of two dimensions,namely technology structure and breakthrough paths.The technology structure consists of fundamental principles,design paradigms,and manufacturing processes,while the breakthrough paths consist of high-end penetration of peripheral modules,focused breakthroughs of key modules,and disruptive reconstruction of architectural rules.The breakthrough mechanism for key core technologies comprises five technological evolution units.These are theoretical-driven unit,feedback-iterative unit,technological-leap unit,collaborative-support unit,and architectural-upgrade unit.These units embody the fundamental relationships among technology types and define the structural form of the breakthrough mechanism.Furthermore,these five technological evolution units respectively represent knowledge transmission flow,knowledge feedback flow,knowledge leap flow,knowledge collaboration flow,and knowledge reorganization flow,thereby uncovering the mechanisms of technological accumulation,feedback,leap,collaboration,and reconstruction.
苗圃, 张晓燕. 关键核心技术解构及其突破机理:基于光刻机与3D NAND闪存芯片的比较研究[J]. 中国科技论坛, 2025(12): 62-71.
Miao Pu, Zhang Xiaoyan. Deconstruction of Key Core Technologies and Their Breakthrough Mechanisms: A Comparative Study Based on Lithography Machines and 3D NAND Flash Chips. , 2025(12): 62-71.
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